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X-ray scattering and diffraction analysis is a powerful tool used for investigating the crystallography and ordered structures of materials. It is widely used for phase indentification and quantitative analysis of known compounds. It is also used for structure determination of new compounds. Additional information such as residual stress, crystal quality, and thin film quality can be determined from advanced X-ray diffraction based techniques.
Our facility covers a wide range of X-ray diffraction based characterization techniques to handle different types of materials. We also host a variety of analytical software to aid the analysis of X-ray diffraction data.
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