Training & Courses

Short courses

FACTS is launching a series of short courses with the intention to give all users some introduction to the various electron microscopy and X-Ray diffraction (EMXRD) techniques offered in FACTS.

These courses aim to provide both current and potential users a platform to explore the capabilities available in FACTS. They should provide some fundamental understanding of common EMXRD techniques. The attendees can also learn how these techniques can be used in their research, in particular for chemical, structural and morphological analysis of materials.

These courses are recommended as a bridging course for new post-graduate students or staff who are new to materials characterization; or anyone who needs refresher course in EMXRD techniques.

Upcoming Events 

Short courses for 2020:

Introduction to X-ray Diffraction and Analysis

Date/Time: 15 Oct 2020 (Thursday), 10:00 - 12:00

Location: Lecture Theatre at The Arc (LHN-LT)

Speaker: Dr. Samuel A. Morris

This introductory course to X-ray Diffraction will cover the basics of the crystalline state, the theory of how X-rays interact with crystalline matter and how to run an X-ray diffraction experiment with a few tips and tricks. 

The talk will be split up into two 45-minute sessions, by the end of which you will be able to take your crystalline powder, obtain an X-ray diffraction pattern and understand the basics of how to analyse it.

Click here to register

Introduction to Scanning Electron Microscopy (SEM)

Date/Time: 15 October 2020 (Thursday), 13:00 - 14:30

Location: Lecture Theatre at The Arc (LHN-LT)

Speaker: Dr. Derrick Ang

This short course aims to introduce potential users to the basics of SEM, its capabilities, and its limitations. 
By developing a theoretical understanding of the technique, it is hoped that new users will learn more quickly, work more efficiently, and maximize the capabilities of these instruments to excel further in their research.

Click here to register

Introduction to Transmission Electron Microscopy (TEM)

Date/Time: 8 October 2020 (Thursday), 10:00 – 12:00

Location: Lecture Theatre at The Arc (LHN-LT)

Speaker: Dr. Chris Boothroyd

Transmission Electron Microscopy made simple. 
This introductory TEM course contains essential knowledge for new users and offers a valuable recap for existing users.

Click here to register

SEM-based X-ray microanalysis (EDS and WDS) 

Date/Time:  21 October 2020 (Wednesday), 2-4pm 

Location:  TELS studio, ABN B4 

Format:  in-person (limit 20 participants)  

Instructor:  Dr. Jason S. Herrin 

Moderator:  Alan Lim
Course Description:  Using x-ray signals produced by the electron beam, microanalysts can determine the chemical composition of samples at specific regions of interest. Both qualitative and quantitative microanalyses are possible, as is chemical mapping of specimens. Energy-Dispersive Spectroscopy (EDS) and Wavelength-Dispersive Spectroscopy (WDS) are two related X-ray analytical techniques available to FACTS users, and we will discuss both methods in terms of their theory and applications. 

​Click here to register

Probing at the nanoscale using Small and Wide Angle X-ray Scattering (SAXS/WAXS) technique

Date/Time:  22 October 2020 (Thursday), 2-4pm 

Location:  TELS studio, ABN B4 

Format:  in-person (limit 20 participants) 

Instructor:  Dr. Pio Buenconsejo 

Course Description:  Small angle X-ray scattering (SAXS) is used to study the structure of a material at length scales in the nanometer range to investigate size, shape, order, orientation and distribution. Wide angle X-ray scattering (WAXS) on the other hand captures the interatomic distances at the sub-nanometer range shedding light on the atomic ordering and/or crystallinity of the material. The course will introduce new users on the basic principles of SAXS/WAXS, transmission and grazing incident experiment, data analysis and some examples related to materials science research. 

Click here to register

Past Events 

Past FACTS Short courses.pdf

Available short course slides:

FACTS SEM bridging course 2019 (for attendees).pdf

Intro to TEM FACTS 2019.pdf

FACTS Introduction to X-ray Diffraction Oct 10th 2017 by Dr Samuel Morris.pptx

Short Course Thin film XRD GIXRD RSA Buenconsejo 2019.pdf