FACTS is launching a series of short courses with the intention to give all users some introduction to the various electron microscopy and X-Ray diffraction (EMXRD) techniques offered in FACTS.
These courses aim to provide both current and potential users a platform to explore the capabilities available in FACTS. They should provide some fundamental understanding of common EMXRD techniques. The attendees can also learn how these techniques can be used in their research, in particular for chemical, structural and morphological analysis of materials.
These courses are recommended as a bridging course for new post-graduate students or staff who are new to materials characterization; or anyone who needs refresher course in EMXRD techniques.
|EPMA Refresher: Analysis of natural silicate glasses|
Date: 14 February
Time: 10am onward
Instructor: Jason Herrin (Dr)
Location: EPMA facility at FACTS
Participation: Limited to 5 participants
This is a follow up session for participants of
our October EPMA course. The focus of this session will be analysis of
beam-sensitive natural silicate glasses at low current. Hands-on training will
include modelling of bremsstrahlung background by mean atomic number,
time-dependent intensity correction, defocused beam analysis, optimization of
counting times, and consideration of appropriate primary and secondary
reference materials. Participants are encouraged to share difficulties that
they’ve faced in a supportive environment.
X-ray diffraction analysis of thin films and surfaces: i) GIXRD and ii) Residual stress analysis
Date/Time: 5 March 2019 (Tuesday), 13:30 -16:00
Location: TELS room at AToM@FACTS ABN
Speaker: Pio John Buenconsejo (Dr)
This is part of a series of short courses on X-ray scattering and diffraction analysis of thin films and surfaces. The selected topics are primarily focused on the available techniques and capabilities of FACTS.
In this course i) grazing/glancing XRD (GIXRD) and ii) residual stress analysis (RSA) will be discussed. GIXRD is a technique used to probe thin films and surfaces by controlling the depth of X-ray penetration to carry out scattering and diffraction analysis. The collected data contains depth sensitive information on phase ID, structure and microstructure. RSA is a technique used to non-destructively investigate the residual stresses in thin films and surfaces. The state of stress in the material strongly influences the mechanical and functional properties. Conventional diffraction stress analysis and thin film focused stress analysis will be discussed.
Note: Attendees should have at least a basic background knowledge of X-ray diffraction analysis
Short courses for 2019 (more details to follow):
- Introduction and advanced topics on Transmission Electron Microscopy (TEM)
- Advanced topics on X-ray diffraction techniques and analysis
- Introduction to Small Angle X-ray Scattering
Past FACTS Short courses.pdf
Available short course slides:
FACTS SEM bridging course 2018 (for users).pdf
FACTS Introduction to X-ray Diffraction Oct 10th 2017 by Dr Samuel Morris.pptx