Facility for Analysis Characterisation Testing & Simulation

Charges

​For interested users, please take note:

  1. Charges below do not include Goods and Service Tax (GST)
  2. Office hours refer to 8 am - 6 pm (Monday to Friday; excluding public holidays)
  3. Charging applies to all research staff and students.
  4. Undergraduates are only allowed to operate Thermionic SEMs and XRD cluster 1.
  5. Undergraduates are allowed to use XRD cluster 2 (subject to approval).
    They have to submit their samples to the person in-charge. Charges will be incurred.
  6. Minimum 1 hour usage charge for SEM/XRD, 2 hours for TEM / FIB.
  7. For priority booking, a 100% extra charge will be imposed.
  8. Charges will still apply if users cancel booking within 24 hours or fail to turn up for usage thereafter. Hence, users are advised to cancel their slot early, in order for other users to use the instrument.
  9. For non-NTU users, only Usage with technical assistance from our scientists.
    Please email us at facts@ntu.edu.sg for a quote, including full details on your samples.


* For single crystal XRD, each sample run is capped @ 300 SGD/hr.

** For EPMA, usage with technical assistance only. 50% discount for long single overnight runs. 

*** For FIB training, if user is not proficient enough to operate the FIB at the end of the training, extra day(s) of training will be required at the rate of 400SGD/day.

​CAA 1st June 2019

Usage Hourly Rates

​University

(Operate without assistance)
​University

(Usage With assistance)
​Other Academic Institution
(Usage With Assistance)
TEM Cluster
​TEM 2100F60
240
312
​TEM 201045
225
293
TEM Carl-Zeiss Libra 120 (low kV)
57
237
308
TEM Carl-Zeiss Libra 120 (low kV Cryo)
​62
242
316

Aberration-Corrected TEM Cluster
​ACTEM ​JEOL ARM200F/ARM300F
​80
​390
​507

Focused Ion Beam
Zeiss Crossbeam 540 FIB***
62
​192
250

Field-Emission SEM Cluster
​FESEM 7800F PRIME
​50
​170
​221
​FESEM 7600F
33
153
199​
FESEM 6340F
26
146​190​
​E-beam lithography system
​10
-
​-

Thermionic SEM Cluster
Thermionic ​SEM 6360
16
136
177
Thermionic SEM 5500LV16136177
Thermionic SEM 5410
16136177

XRD Cluster 1
XRD ​Shimadzu Powder
14
114​148​
XRD ​Shimadzu Thin Film
14114148
​XRD Cluster 2
XRD ​Bruker D8 Advance 19
119
155
XRD ​Panalytical X'Pert Pro 19119155
XRD Cluster 3
​High Temperature XRD Siemens D5005 ​17
117
152​
Bruker D8 Discover HR-XRD ​21
141​183​
Bruker SMART APEX II SC-XRD*​25
145​
189
Small-Wide Angle X-ray Scattering

SWAXS Anton-Paar SAXSess
15
135
176
SWAXS ​Xenocs Nano-inXider
​32
​152
​198




Microanalysis / Surface techniques
​EPMA JEOL JXA-8530F**
​--
181
​235
​XPS Kratos AXIS Supra
​70
​140
​182




Specimen Preparation Cluster
(no assistance)
​PIPS6​
​Ultramicrotome​10
​Cryo-ultramicrotome​20
​Disc cutter & grinder​3
​Dimpler​3
​Cryoplunge​30
​Training
​TEM 2100F
​400
​TEM 2010
​400
​TEM Libra 120
​400
​ACTEM ARM200F

​2,340

​Cryo-TEM training
400/day​
​FE-SEM cluster
(including FESEM 6340F and FESEM 7600F)

300​
FE-SEM 7800F PRIME
​100

FE-SEM 7800F EBSD Training
​50
Thermionic ​SEM cluster
​200
​XRD cluster 1
50
​XRD cluster 2​200
​XRD cluster 3
​250
​E-beam lithography training
(on FESEM 7600F)

​100
​Specimen Prep Training (PIPS, Dimpler, Disc Cutter & Grinder)​100
​Specimen Prep Training (Ultramicrotome)200
​Specimen Prep Training (Cryoplunger)
​150
FIB training​
830 / training***​
​XPS Training

​1,200 / training