For interested users, please take note:
- Charges below do not include Goods and Service Tax (GST)
- Office hours refer to 8 am - 6 pm (Monday to Friday; excluding public holidays)
- Charging applies to all research staff and students.
- Undergraduates are only allowed to operate Thermionic SEMs and XRD cluster 1.
- Undergraduates are allowed to use XRD cluster 2 (subject to approval).
They have to submit their samples to the person in-charge. Charges will be incurred. - Minimum 1 hour usage charge for SEM/XRD, 2 hours for TEM / FIB.
- For priority booking, a 100% extra charge will be imposed.
- Charges will still
apply if users cancel booking
within 24 hours or fail to turn up for usage thereafter. Hence, users are advised to cancel their slot early, in order for other users to use the instrument.
- For non-NTU users, only Usage with technical assistance from our scientists.
Please email us at facts@ntu.edu.sg for a quote, including full details on your samples.
* For single crystal XRD, each sample run is capped @ 300 SGD/hr.
** For EPMA, usage with technical assistance only. 50% discount for long single overnight runs.
*** For FIB training, if user is not proficient enough to operate the FIB at the end of the training, extra day(s) of training will be required at the rate of 400SGD/day.
+ Discounted rate - Non-discounted rate 110SGD/hr
CAA 1st June 2019
Usage Hourly Rates
| TEM Cluster | |
| |
| TEM 2100F | 60
| 240
| 312
|
| TEM 2010 | 45
| 225
| 293
|
TEM Carl-Zeiss Libra 120 (low kV)
| 57
| 237
| 308
|
TEM Carl-Zeiss Libra 120 (low kV Cryo)
| 62
| 242
| 316
|
| |
| | |
| Aberration-Corrected TEM Cluster | | | |
ACTEM JEOL ARM200F/ARM300F
| 80+
| 390
| 507
|
| | | |
Focused Ion Beam
| | | |
Zeiss Crossbeam 540 FIB***
| 62
| 192
| 250
|
| | | |
| Field-Emission SEM Cluster | | | |
FESEM 7800F PRIME
| 40
| 160
| 208
|
FESEM 7600F
| 33
| 153
| 199 |
FESEM 6340F
| 26
| 146 | 190 |
E-beam lithography system
| 10
| -
| -
|
| |
| | |
| Thermionic SEM Cluster | | | |
Thermionic SEM 6360
| 16
| 136
| 177
|
| Thermionic SEM 5500LV | 16 | 136 | 177 |
Thermionic SEM 5410
| 16 | 136 | 177
|
| | | |
| XRD Cluster 1 | | | |
XRD Shimadzu Powder
| 14
| 114 | 148 |
XRD Shimadzu Thin Film
| 14 | 114 | 148 |
| | | | |
| XRD Cluster 2 | | | |
| XRD Bruker D8 Advance | 19
| 119
| 155
|
| XRD Panalytical X'Pert Pro | 19 | 119 | 155 |
| | | | |
XRD Cluster 3
| | | |
| Bruker D8 Discover HR-XRD | 21
| 141 | 183 |
| Bruker SMART APEX II SC-XRD* | 25
| 145
| 189
|
| | | | |
| Small-Wide Angle X-ray Scattering |
| |
|
SWAXS Anton-Paar SAXSess
| 15
| 135
| 176 |
SWAXS Xenocs Nano-inXider
| 32
| 152
| 198
|
|
|
|
|
Microanalysis / Surface techniques
| | |
|
EPMA JEOL JXA-8530F**
| --
| 181
| 235
|
XPS Kratos AXIS Supra
| 70
| 140
| 182
|
XRF S8 Tiger
| 52
| 212
| --
|
| | | |
| | | |
Specimen Preparation Cluster
(no assistance) | | | |
| PIPS | 6 | | |
| Ultramicrotome | 10 | | |
| Cryo-ultramicrotome | 20 | | |
| Disc cutter & grinder | 3 | | |
| Dimpler | 3 | | |
| Cryoplunge | 30 | | |
| | | | |
| Training | | | |
TEM 2100F
| | 400 | |
TEM 2010
| | 400 | |
TEM Libra 120
| | 400 | |
ACTEM ARM200F
|
| 2,340
|
|
Cryo-TEM training
| | 400/day | |
FE-SEM cluster
(including FESEM 6340F and FESEM 7600F/7800F)
|
| 350 |
|
FE-SEM 7800F EBSD Training
| | 50
| |
Thermionic SEM cluster
| | 200 | |
XRD cluster 1
| | 50 | |
| XRD cluster 2 | | 200 | |
XRD cluster 3
| | 250 | |
E-beam lithography training
(on FESEM 7600F)
|
| 100
| |
| Specimen Prep Training (PIPS, Dimpler, Disc Cutter & Grinder) | | 100 | |
| Specimen Prep Training (Ultramicrotome) | | 200
| |
| Specimen Prep Training (Cryoplunger) |
| 150 | |
FIB training
| | 830 / training*** | |
XPS Training
|
| 1,200 / training
|
|
