Facility for Analysis Characterisation Testing & Simulation



To celebrate the opening of ATo​​M@FACTS, we are pleased to announce an interdisciplinary symposium and inauguration ceremony to be held on 11th January 2019 at Nanyang Technological University, Singapore.
AToM, which houses advanced electron microscopes for the Facility for Analysis Characterisation Testing and Simulation (FACTS) and the NTU Institute of Structural Biology (NISB) in specially designed low-noise and low-vibration rooms, is equipped with nine instruments for high-resolution imaging of atoms and cells. The coexistence of microscopy techniques for both physical and life sciences within AToM will bring forth multidisciplinary expertise ​and stimulate interaction between these dynamic research areas.​
This 1-day event is free and open to all. To register for the event, please click here.

Upcoming Seminars

Upcoming Short courses

Soft Launch of Kratos AXIS Supra XPS

Announcement Date: 27th Aug 2018

The latest addition to our characterization suite is a Kratos AXIS Supra X-ray photoelectron spectrometer. It is a surface-sensitive tool, which can provide quantitative elemental composition and chemical state information from the uppermost layers of a material. The instrument is capable to perform in both spectroscopic and parallel imaging modes, owing to the efficient collection of photoelectrons and low aberrations of the optics. It is also equipped with a multi-mode Ar Gas Cluster Ion Source (GCIS) for sputter depth profiling of both hard and soft materials, sample heating and cooling kit for in-situ thermal treatment, and surface science accessories, such as He UV lamp for ultraviolet photoelectron spectroscopy (UPS) and ion source for ion scattering spectroscopy (ISS).

The specifications of the Kratos AXIS Supra can be found in this link: (http://research.ntu.edu.sg/facts/Facilities/Pages/XPS.aspx)

During this soft launch period, we will provide measurement with assistance for the samples submitted. Please refer to the table below for the hourly usage costs. Users are encouraged to approach FACTS scientists for discussion prior to sample submission. User training for XPS will be announced at a later date.

For further enquiries, please contact Dr Teddy Salim (tsalim@ntu.edu.sg) or Dr Liu Weiling (liuwl@ntu.edu.sg).

 Usage without Assistance (Instrument Hour)

Usage with Assistance
(Instrument + Staff Hour)

Discounted Rates*60 SGD/hour160 SGD/hour


* Introductory cost, usage costs to be reviewed after 6 months
# Total cost depends on the staff hour involved


Official launch of the ZEISS Crossbeam 540 FIB

Annoucement date: 8th August 2018

NTU FACTS's most recent acquisition is a Zeiss Crossbeam 540 focused ion beam FIB. It is a versatile analytical tool for materials science, semiconductor industry, etc. It is built on a FESEM platform for site-specific analysis, cross-sectioning, deposition and removal of materials, TEM lamella preparation and so on. The FIB is equipped with a Ga ion beam, Pt and C gas injection systems and an in-situ manipulator for lamella preparation and nanofabrication work.

The specifications of the FIB can be found on the FACTS website:  (http://research.ntu.edu.sg/facts/Facilities/Pages/FIB.aspx)

It is now officially open to NTU users who have an interest in this instrument. Users are expected to have experience of using FESEM and pass the OMNI SEM test before training on the FIB. Training for the FIB typically takes about 2 days. Please refer to table below for training and usage costs.

For further enquiries, please fill up this questionaire found at this link [click here​], and forward this to Dr Derrick Ang (dang@ntu.edu.sg) or Dr Lek Jun Yan (jylek@ntu.edu.sg).

 Usage without assistanceUsage with assistanceTraining
Discounted Rates*60 SGD / hour110 SGD / hour830 SGD / training #


* Introductory cost, usage costs to be reviewed after 6 months.

# If user is not proficient enough to operate the FIB at the end of the training, extra day(s) of training will be required at the rate of 400 SGD / day.​


Usage of JEOL ARM200F a​​​berration-corrected transmission electron microscope

​Announcement date: 2017 May 18th

Revised: 2017 Oct 24th                   

NTU FACTS most recent acquisition is a JEOL ARM200F TEM with a probe aberration corrector. This state of the art instrument is capable of achieving resolutions of at least 78pm at 200kV and 136pm at 80kV in high-angle annular dark-field (HAADF) STEM images. It also has an energy-dispersive X-ray detector that can form ​elemental maps at atomic resolution and a fast CMOS camera. It is now officially open to NTU users who have an interest in this instrument to deepen their understanding of their materials at the atomic scale.

The full specifications and capabilities of the aberration corrected TEM can be found on the FACTS website (http://research.ntu.edu.sg/facts/Facilities/Pages/AC-TEM.aspx).

Users are expected to have experience of using TEM (and preferably STEM) before being trained on the ARM200. Training for the ARM200F typically takes about 3 days. For training and usage costs please see table below.

If you are interested in using the ARM200F, please fill in the short proposal form (http://research.ntu.edu.sg/facts/Facilities/Documents/ARM200F-Applications-v1.4.doc) and return it to FACTS. For further enquiries, please contact Dr Chris Boothroyd (cbb@ntu.edu.sg) or Dr Tay Yee Yan (yytay@ntu.edu.sg).

  Usage without Assistance
Rates  110 SGD / hour4,680 SGD / training
Discounted Rates77 SGD / hour
2,340 SGD / training#

* Introductory cost, usage cost to be reviewed after 6 months from 1st Dec 2017 till 1st May 2018

# Training cost to be reviewed after 1 year from 1st June 2017