Official Launch of Kratos AXIS Supra XPS

Announcement Date: 25th Feb 2019

One of the latest additions to our characterization suite is a Kratos AXIS Supra X-ray photoelectron spectrometer. It is a surface-sensitive tool, which can provide quantitative elemental composition and chemical state information from the uppermost layers of a material. The instrument can be used in both spectroscopic and parallel imaging modes, owing to the efficient collection of photoelectrons and low aberrations of the optics. It is also equipped with a multi-mode Ar Gas Cluster Ion Source (GCIS) for sputter depth profiling of both hard and soft materials, sample heating and cooling kit for in-situ thermal treatment, and surface science accessories, such as He UV lamp for ultraviolet photoelectron spectroscopy (UPS) and ion source for ion scattering spectroscopy (ISS).

The full specifications of the Kratos AXIS Supra can be found in this link: (http://research.ntu.edu.sg/facts/Facilities/Pages/XPS.aspx) 

Equipment Training

The instrument is now officially open to NTU users who are interested in the technique. Given the system is rather delicate and requires special maintenance due to the UHV components, the XPS training will be limited to individuals in groups who will use XPS frequently for a large part of their research.
The training will only cover basic spectroscopic measurements and machine technical handling. In the future, users with instrument access can be trained on the GCIS on a case-by-case basis.

Keen individuals are required to submit details regarding their work in the form below and submit the completed form to FACTS. To be eligible for training, applicants should have at least one year remaining in their current positions and be expecting to use XPS on a regular basis. The staff in-charge will contact potential trainees for training arrangement. The first training is expected to commence in May 2019.

Link to application form: [Click here]

Usage with Assistance

Due to the high commitment required to be an independent user of the XPS at FACTS, users who wish to use the instrument occasionally can submit their samples for usage with assistance. The staff in-charge will perform the data collection on behalf of the users. Less frequent users can also be shown how to perform independent data processing.

Revision of Usage Charges

The usage charges for XPS are revised to better reflect the operational and maintenance costs. The usage with assistance is now based on hourly flat rate, with no distinction between the staff and instrument hours. The official-launch rates will commence in 1st April 2019.

For further enquiries, please contact Dr Teddy Salim (tsalim@ntu.edu.sg) or Dr Liu Weiling (liuwl@ntu.edu.sg). 

# Basic one-full-day training includes spectroscopy and XPS imaging and is to be conducted in a small group. Potential trainees are expected to pass an XPS theory test before the training. Trained users will learn how to independently prepare and load the samples, prepare instrumentation, set up analysis scans, export and analyse data. 

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Announcement Date: 27th Aug 2018

The latest addition to our characterization suite is a Kratos AXIS Supra X-ray photoelectron spectrometer. It is a surface-sensitive tool, which can provide quantitative elemental composition and chemical state information from the uppermost layers of a material. The instrument is capable to perform in both spectroscopic and parallel imaging modes, owing to the efficient collection of photoelectrons and low aberrations of the optics. It is also equipped with a multi-mode Ar Gas Cluster Ion Source (GCIS) for sputter depth profiling of both hard and soft materials, sample heating and cooling kit for in-situ thermal treatment, and surface science accessories, such as He UV lamp for ultraviolet photoelectron spectroscopy (UPS) and ion source for ion scattering spectroscopy (ISS).

The specifications of the Kratos AXIS Supra can be found in this link: (http://research.ntu.edu.sg/facts/Facilities/Pages/XPS.aspx)

During this soft launch period, we will provide measurement with assistance for the samples submitted. Please refer to the table below for the hourly usage costs. Users are encouraged to approach FACTS scientists for discussion prior to sample submission. User training for XPS will be announced at a later date.

For further enquiries, please contact Dr Teddy Salim (tsalim@ntu.edu.sg) or Dr Liu Weiling (liuwl@ntu.edu.sg).

* Introductory cost, usage costs to be reviewed after 6 months
# Total cost depends on the staff hour involved

Official launch of the ZEISS Crossbeam 540 FIB

Annoucement date: 8th August 2018

NTU FACTS's most recent acquisition is a Zeiss Crossbeam 540 focused ion beam FIB. It is a versatile analytical tool for materials science, semiconductor industry, etc. It is built on a FESEM platform for site-specific analysis, cross-sectioning, deposition and removal of materials, TEM lamella preparation and so on. The FIB is equipped with a Ga ion beam, Pt and C gas injection systems and an in-situ manipulator for lamella preparation and nanofabrication work.

The specifications of the FIB can be found on the FACTS website:  (http://research.ntu.edu.sg/facts/Facilities/Pages/FIB.aspx)

It is now officially open to NTU users who have an interest in this instrument. Users are expected to have experience of using FESEM and pass the OMNI SEM test before training on the FIB. Training for the FIB typically takes about 2 days. Please refer to table below for training and usage costs.

For further enquiries, please fill up this questionaire found at this link [click here​], and forward this to Dr Derrick Ang (dang@ntu.edu.sg) or Dr Lek Jun Yan (jylek@ntu.edu.sg).

* Introductory cost, usage costs to be reviewed after 6 months.

# If user is not proficient enough to operate the FIB at the end of the training, extra day(s) of training will be required at the rate of 400 SGD / day.​

Usage of JEOL ARM200F a​​​berration-corrected transmission electron microscope

​Announcement date: 2017 May 18th

Revised: 2017 Oct 24th                   

NTU FACTS most recent acquisition is a JEOL ARM200F TEM with a probe aberration corrector. This state of the art instrument is capable of achieving resolutions of at least 78pm at 200kV and 136pm at 80kV in high-angle annular dark-field (HAADF) STEM images. It also has an energy-dispersive X-ray detector that can form ​elemental maps at atomic resolution and a fast CMOS camera. It is now officially open to NTU users who have an interest in this instrument to deepen their understanding of their materials at the atomic scale.

The full specifications and capabilities of the aberration corrected TEM can be found on the FACTS website (http://research.ntu.edu.sg/facts/Facilities/Pages/AC-TEM.aspx).

Users are expected to have experience of using TEM (and preferably STEM) before being trained on the ARM200. Training for the ARM200F typically takes about 3 days. For training and usage costs please see table below.

If you are interested in using the ARM200F, please fill in the short proposal form (http://research.ntu.edu.sg/facts/Facilities/Documents/ARM200F-Applications-v1.4.doc) and return it to FACTS. For further enquiries, please contact Dr Chris Boothroyd (cbb@ntu.edu.sg) or Dr Tay Yee Yan (yytay@ntu.edu.sg).

^* Introductory cost, usage cost to be reviewed after 6 months from 1^st Dec 2017 till 1^st May 2018

^# Training cost to be reviewed after 1 year from 1^st June 2017