In FACTS we hosts a range of advanced electron- and X-ray-beam based instrumentation for the chemical, structural and crystallographic analysis of materials. An electron beam interacting with materials produces various signals that can be collected and processed to provide the structural and chemical information. Similarly an X-ray beam can also be used to provide structural and chemical information. Both methods complement each other to yield rich amount of information required to fully understand the materials properties.

An overview of electron-beam and X-ray beam interaction with materials are shown below. The core purpose of our facility is to optimally capture all these signals and evaluate them properly.

Available hardware and software can be found at the side navigation panel for more details.
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