X-ray diffraction (XRD) analysis is a powerful tool used for understanding the crystallographic structure of materials. It is widely used to identify phases and perform quantitative analysis. It is also used to determine the crystal structures of new compounds. Additional information such as residual stress, crystal quality, and thin film quality can be determined from advanced X-ray diffraction based techniques.
Our facility covers a wide range of X-ray diffraction based characterization techniques to handle different types of materials. We also host a variety of analytical software to aid the analysis of X-ray diffraction data.
Contact Persons:
Note: For New User Info, please click [ here ] for more information.
Powder XRD
- Liu Weiling (Dr), email: liuwl@ntu.edu.sg
- Pio John S. Buenconsejo (Dr), email:
pbuenconsejo@ntu.edu.sg
Specialized Thin Film XRD Technique
Single Crystal XRD
- Samuel Morris (Dr), email: smorris@ntu.edu.sg
- Pio John S. Buenconsejo (Dr), email: pbuenconsejo@ntu.edu.sg
Powder XRD Thin Film XRD
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Shimadzu XRD-6000
Two systems are available and configured for powder XRD and thin film XRD analysis.
Specifications
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 | Bruker D8 Advance XRD For powder XRD analysis of multiple samples.
Specifications - Cu-Ka radiation operated at 40kV and 40mA
- Vertical high precision goniometer
- LynxEye 1-dimensional detector is based on the silicon strip detector technology capable of collecting at high count rate. A high quality data with high intensity can be collected in a short time
- Batch sample automatic loader
- Beam knife attachment for data collection with low background at low 2Theta angle
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Panalytical XRD
For powder XRD analysis of multiple samples.
Specifications:
Vertical high precision goniometer X'Celerator detector based on real time multiple strip X-ray detection for ultrafast data collection Batch sample automatic loader Beam knife attachment for data collection with low background at low 2Theta angle
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Siemens D5005 HT-XRD
For powder XRD analysis at high temperatures.
Specifications:
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Bruker D8 Discover HR-XRD
For high-resolution XRD (HRXRD) ananlysis, such as X-ray reflectivity and reciprocal space mapping. Other functions: pole figure data collection, residual strain/stress analysis.
Specifications:
- Cu-Ka radiation operated at 40kV and 40mA
- Parallel beam profile
- Monochromator (attachable)
- High-precision horizontal goniometer attached with Euler cradle including an X-Y-Z motion
- Sample stage can accomodate up to 4-inch wafer samples
- Beam can be configured as point (1 mm)collimated
- Detectors: 1) Lynxeye 1D, 2) Scintillation 0D
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  | Bruker Smart APEXII SC-XRD
For single crystal diffraction analysis. It has 3-axis goniometer with a fixed chi system, and capable of cooling the sample to 100 K. The diffracted X-rays are collected using a 2D area detector. It can atuomatically collect refined series of 2D diffraction data for structure determination of single crystals.
Specifications: - Mo-Ka radiation operated at 50kV and 30mA
- Point collimated beam
- High-precision horizontal goniometer base with 2theta, omega and phi drives, and a fixed chi.
- APEX II CCD detector with a four-port readout of a 4096 by 4096 CCD chip
- Video microscope to aid the sample alignment
- Low temperature cooling atacment that provides sample cooling to 100K by blowing cold nitrogen gas
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