Facilities

AC-TEM

​Aberr​ation-Corrected Transmission Electron Microscope​

Contact Persons:

1. Tay Yee Yan (Dr), email: yytay@ntu.edu.sg

2. Chris Boothroyd (Dr), email: cbb@ntu.edu.sg

Please download the application form (ARM200F-Applications-v1.4.doc) and return the completed form to us.

tem arm200f.jpg
JEM-ARM200F
 
 
TEM mode at 200 kV
 
1. Lattice Resolution 0.072 nm
 
2. Point resolution 0.189 nm
 
 
STEM Mode with Probe Corrector
 
1. HAADF Resolution < 0.078 nm at 200 kV
 
2. HAADF Resolution < 0.136 nm at 80 kV
 
3. Aberration Free Area Angle: 40 mrad at 200 kV
 
4. Aberration Free Area Angle: 35 mrad at 80 kV
 
 
Other Features:
 
1. Gatan One-View CMOS Camera 4k x 4k 
 
2. Oxford X-Max TLE 100 mm2 windowless EDX silicon drift detector (~0.7 sr solid angle)
 
3. High Angle Annular Dark Field, Annular Bright Field and Bright Field STEM Technique​​


JEOL_GrandArm.jpg
JEM-GrandARM (with Cold FEG) 
 
 

TEM Mode with Image Corrector

1. @ 300 KV

    a. Information Limit: <0.08nm 

    b. Lattice Resolution: <0.06nm


2. @ 80 KV

    a. Information Limit: <0.13nm


3. @ 60KV

    a. Information Limit: <0.16 nm


STEM Mode with Probe Corrector

  1. HAADF Resolution <0.078 nm at 300KV
  2. HAADF Resolution <0.136 nm at 80KV
  3. HAADF Resolution <0.192 nm at 60KV
  4. Aberration Free Area Angle: 36mrad at 300KV
  5. Aberration Free Area Angle: 25.5 mrad at 80KV
  6. Aberration Free Area Angle: 25 mrad at 60KV


Other Features

Gatan One-View CMOS Camera 4k x 4k with In-situ Imaging Features

JEOL JED-2300T EDX 100mm2 windowless EDX Silicon drift detector (~0.98 sr solid angle)

High Angle Annular Dark Field, Annular Bright Field and Bright Field STEM Technique

Gatan GIF Quantum 965 with dual-EELS and EDX-EELS synchronization data collection features

Electron Holography

Electron Tomography