Facilities

AC-TEM

​Aberr​ation-Corrected Transmission Electron Microscope​

Contact Persons:

1. Tay Yee Yan (Dr), email: yytay@ntu.edu.sg

2. Chris Boothroyd (Dr), email: cbb@ntu.edu.sg

Please download the application form (ARM200F-Applications-v1.4.doc) and return the completed form to us.

tem arm200f.jpg
JEM-ARM200F
 
 
TEM mode at 200 kV
 
1. Lattice Resolution 0.072 nm
 
2. Point resolution 0.189 nm
 
 
STEM Mode with Probe Corrector
 
1. HAADF Resolution < 0.078 nm at 200 kV
 
2. HAADF Resolution < 0.136 nm at 80 kV
 
3. Aberration Free Area Angle: 40 mrad at 200 kV
 
4. Aberration Free Area Angle: 35 mrad at 80 kV
 
 
Other Features:
 
1. Gatan One-View CMOS Camera 4k x 4k with In-situ Imaging Features
 
2. Oxford X-Max TLE 100 mm2 windowless EDX silicon drift detector (~0.7 sr solid angle)
 
3. High Angle Annular Dark Field, Annular Bright Field and Bright Field STEM Technique​​