Training & Courses

Short courses

FACTS is launching a series of short courses with the intention to give all users some introduction to the various electron microscopy and X-Ray diffraction (EMXRD) techniques offered in FACTS.

These courses aim to provide both current and potential users a platform to explore the capabilities available in FACTS. They should provide some fundamental understanding of common EMXRD techniques. The attendees can also learn how these techniques can be used in their research, in particular for chemical, structural and morphological analysis of materials.

These courses are recommended as a bridging course for new post-graduate students or staff who are new to materials characterization; or anyone who needs refresher course in EMXRD techniques.

Upcoming Events 

Short courses for 2020:


Introduction to X-ray Diffraction and Analysis


Date/Time: 15 Oct 2020 (Thursday), 10:00 - 12:00

Location: Lecture Theatre at The Arc (LHN-LT)

Speaker: Dr. Samuel A. Morris

This introductory course to X-ray Diffraction will cover the basics of the crystalline state, the theory of how X-rays interact with crystalline matter and how to run an X-ray diffraction experiment with a few tips and tricks. 

The talk will be split up into two 45-minute sessions, by the end of which you will be able to take your crystalline powder, obtain an X-ray diffraction pattern and understand the basics of how to analyse it.

Click here to register for event at LHN-LT

Click here to register for concurrent MS Teams live event

Introduction to Scanning Electron Microscopy (SEM)

Date/Time: 15 October 2020 (Thursday), 13:00 - 14:30

Location: Lecture Theatre at The Arc (LHN-LT)

Speaker: Dr. Derrick Ang

This short course aims to introduce potential users to the basics of SEM, its capabilities, and its limitations. 
By developing a theoretical understanding of the technique, it is hoped that new users will learn more quickly, work more efficiently, and maximize the capabilities of these instruments to excel further in their research.

Click here to register for event at LHN-LT



Introduction to Transmission Electron Microscopy (TEM)


Date/Time: 8 October 2020 (Thursday), 10:00 – 12:00

Location: Lecture Theatre at The Arc (LHN-LT)

Speaker: Dr. Chris Boothroyd

Transmission Electron Microscopy made simple. 
This introductory TEM course contains essential knowledge for new users and offers a valuable recap for existing users.

Click here to register for event at LHN-LT

Click here to register for concurrent MS Teams live event



SEM-based X-ray microanalysis (EDS and WDS) 

Date/Time:  21 October 2020 (Wednesday), 2-4pm 

Location:  TELS studio, ABN B4 

Format:  in-person (limit 20 participants)  

Instructor:  Dr. Jason S. Herrin 

Moderator:  Alan Lim
 
Course Description:  Using x-ray signals produced by the electron beam, microanalysts can determine the chemical composition of samples at specific regions of interest. Both qualitative and quantitative microanalyses are possible, as is chemical mapping of specimens. Energy-Dispersive Spectroscopy (EDS) and Wavelength-Dispersive Spectroscopy (WDS) are two related X-ray analytical techniques available to FACTS users, and we will discuss both methods in terms of their theory and applications. 

​Click here to register



Probing at the nanoscale using Small and Wide Angle X-ray Scattering (SAXS/WAXS) technique

Date/Time:  22 October 2020 (Thursday), 2-4pm 

Location:  TELS studio, ABN B4 

Format:  in-person (limit 20 participants) 

Instructor:  Dr. Pio Buenconsejo 

Course Description:  Small angle X-ray scattering (SAXS) is used to study the structure of a material at length scales in the nanometer range to investigate size, shape, order, orientation and distribution. Wide angle X-ray scattering (WAXS) on the other hand captures the interatomic distances at the sub-nanometer range shedding light on the atomic ordering and/or crystallinity of the material. The course will introduce new users on the basic principles of SAXS/WAXS, transmission and grazing incident experiment, data analysis and some examples related to materials science research. 

Click here to register



A series of advanced topics for Transmission Electron Microscopy (TEM)

Date/Time: 2 Nov 2020 (Mon) - 5 Nov 2020 (Thu), 10:00 am - 12:00 pm

Location: Lecture Theatre at The Arc (LHN-LT)

Speaker: Dr. Chris Boothroyd

Event Info

High-resolution Transmission Electron Microscopy

Our highest resolution transmission electron microscope (TEM) can resolve features with a resolution of better than 0.1nm. But the resulting images are not straightforward to interpret. This talk will cover the theory behind the scattering of electrons by materials, the formation of images in the electron microscope and simulation of images. An understanding of the material covered in the introduction to TEM will be assumed.

 

Scanning Transmission Electron Microscopy

Scanning transmission electron microscopy (STEM) is an alternative to TEM for imaging thin samples in transmission. STEM images are usually easier to interpret than TEM images and STEM can do chemical mapping at high resolution. This talk will cover the theory behind STEM imaging and the variety of information that can be obtained from STEM. An understanding of the material covered in the introduction to TEM will be assumed.

 

X-ray Spectroscopy in the Transmission Electron Microscope

Electron irradiation in a TEM creates X-rays whose energies can be used to identify the elements present in a sample. This talk will cover the generation of X-rays, how X-rays are recorded and how to interpret the resulting spectra. This talk overlaps with some of the material covered in "SEM-based X-ray microanalysis (EDS and WDS)" but will be more focused on TEM. Some understanding of the material covered in the introduction to TEM will be useful.

 

Electron Energy-loss Spectroscopy

When electrons pass through a sample in a TEM the interactions cause energy losses which can be used both to identify the elements present and determine their chemical state. This talk will cover the methods for recording, interpreting and quantifying energy-loss spectra. It will also cover the theory behind the features present in spectra. Some understanding of the material covered in the introduction to TEM will be useful.


click here to register



EBSD Advanced training

Date/Time: Day 1 27th Oct 10-12am ; 2-5pm; Day 2: 28th Oct 10-1230pm

Location: TELS studio, ABN B4

Speaker: Dr. Wu Jiang (Oxford Nanoinstruments Analysis)


This 1.5 day short course is for existing EBSD users, and will cover a list of topics covering hardware and software information of EBSD technique. It is expected that users after this short course will understand the CMOS-EBSD technique better and move to the next level of application use after training.

List of topics to be covered will be as below:

1. Understand  and benefit from CMOS sensor and Symmetry detector 
2. Choose the right SEM conditions for EBSD analysis
3. Insight into EBSD indexing and related parameters in AZtecHKL
4. Practical tips for EBSD map and LAM
7. Grain size measurement using EBSD
6. EBSD data process with AZtecCrystal
5. Introduction to TKD on JSM-7800F

The short course is co-organised by FACTS and Oxford Nanoinstruments (OINA), and Dr Wu Jiang from OINA will be covering the topics above mentioned. This course will be prioritised for existing FACTS EBSD users; other EBSD users are welcome to join - a pre-existing knowledge of EBSD is required.


X-Ray EDS: Data Processing With Aztec Software

Date/Time: 29th Oct 2-5pm

Location: Concurrent TELS Studio, ABN B4 / MS Teams Live Event

Speaker: Dr. Wu Jiang (Oxford Nanoinstruments Analysis)

This 3 hour short course is meant for users who intend to perform data post-processing on their x-ray EDS data, using FACTS's offline Aztec Post-data processing software.

Topics such as treament of spectra, mapping will be covered, together with the familarisation of the new Aztec interface. This will be helpful for users who intend to work with EDS data generated from INCA and Aztec systems found on our SEMs.

This short course requires prior knowledge of x-ray EDS and some experience with Oxford EDS systems.

Click Here To Register


Past Events 

Past FACTS Short courses.pdf

Available short course slides:

FACTS SEM bridging course 2019 (for attendees).pdf

Intro to TEM FACTS 2019.pdf

FACTS Introduction to X-ray Diffraction Oct 10th 2017 by Dr Samuel Morris.pptx

Short Course Thin film XRD GIXRD RSA Buenconsejo 2019.pdf