Nanyang Technology University

Academic Profile
Asst Prof (Adj) Chiam Sing Yang 

Adjunct Assistant Professor 
Division of Physics & Applied Physics 
School of Physical & Mathematical Sciences 
College of Science 



Email: SYCHIAM@ntu.edu.sg
Phone: (+65)65138493 
Office: SPMS-PAP-03-02 
Education
  • PhD (Physics) Imperial College of Sci, Tech & Medicine 2008
  • BEng (Hons) National University of Singapore 2004
Biography
I completed my bachelors in Electrical and Computer Engineering in 2004 from National University of Singapore, before obtaining my doctorate in 2008 from Imperial College London. Over the course of my studies, I was fortunate to have several different experiences including a few working stints in Tech Semiconductor, National Computer System and ST Electronics. I was also involved in a special project group in what was previously Chartered Semiconductor Manufacturing. During my doctorate studies, I was an executive member of the IMRE students committee and was also actively involved in supervision of final year project students, in additional to helping out in lessons and exam marking duties. I have acted as a reviewer for numerous international journals including Applied Physics Letters, Energy and Environmental Science and IEEE Transcations on Device and Materials Reliability. I'm currently working as a research engineer in IMRE.
Research Interests
My application directed interest is directed at energy related research. I am especially interested to study the origin of open circuit voltages in different type of solar cells where charge separation differs. I am also interested in exploring new materials or the use of nanostructures. This can be used for either photovoltaic applications or even photocatalysis. I am also looking at ways to improve transparent conductor. Currently, this is directed at flexible substrates for printed applications.

In another aspect of my interest, I’ll like to understand the interface energy separation between different materials. For example, for oxide-semiconductor, it is subtle but important to consider aspect of extra-atomic relaxation, differential charging and various chemical reactions at the interface before directly utilizing measurements from photoelectron spectroscopy to determine the interface energy alignments. In doing so, we can then critically examine different models in alignment, including charge neutrality model and the interface induced gap states model. I hope to extend the technique to overcome issues of ionization cross section from organic materials to give better accuracy in their HOMO/LUMO alignment.
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